Regarding the current advanced materials, it is required to control the impurities as well as the content of principal component. The technologies to prove the cleanliness are essential for our goal “clean chemistry”. Please refer to our analytic technologies supporting “Clean chemistry”.
Trace metal analysis
We measure the content of trace metals in the electronic materials for manufacturing semiconductors with higher accuracy. Thus, we respond to various requirements from customers with the highest level of quality control.
| Products | Controlling level |
| Polymerization initiator | Order of double digit ppb |
| Polymer, Photoacid generator, Solvent for electronics industry | Order of single ～ double digit ppb |
| Cleaning agent with high-purity/high-performance (for manufacturing semiconductors) | Order of single digit ppb |
| Hydrogen peroxide solution with ultra high-purity (for manufacturing semiconductors) | Order of single ～ double digit ppb |
Quantitative analysis
Regarding the low molecular compounds, we assure the product quality by quantitative analysis with chromatograph such as GC or HPLC as well as titrimetric analysis. Regarding the high molecular compounds, we assure the product quality by measuring the composition ratio of multiple polymer with NMR and measuring each unit ratio with high accuracy. In addition, we can perform the measurement/control depending on each requirement with quantitative technologies of 1H-NMR, 13C-NMR and 19F-NMR.
Organic impurity analysis
We measure and control the content of impurity in the order of ppm with high accuracy by separation analysis with the analytical instrument such as GC, GC/GC, GC/MS, HPLC, UPLC and LC/MS depending on the characteristics of impurities.
Inorganic impurity analysis
We measure and control the content of impurity of halogen, sulfur and phosphorus in the order of ppm with high accuracy.
Other analyses
・We assure the stable quality by performing the physical property testing such as thermal analysis or X-ray diffraction analysis.
・We can measure the impurity concentration at single digit ppm under low humidity environment to respond to the requirement of low moisture measurement.
・In addition, we can measure the content of trace metals with the energy dispersive X-ray spectroscopy.
Our policy
If the problem is difficult to solve, we propose the quality assurance technologies which satisfy our customers by making use of analytical procedure with changed viewpoint for the future of customers. We search for the one step ahead of analytical technologies to prove our products are “clean”, and we respond to the needs of our customers.
